Watch this short video tutorial on how to use the Komodo CAN Duo Interface and the Total Phase Data Center Software to monitor and analyze CAN data in real time.
How to analyze and capture CAN traffic using the Total Phase Komodo CAN interface
Tagged Test & Measurement Development
| Leave a replyIn this tutorial video you will see how to stack the LeCroy waveRunner 64Xi with Acute TL2236 Logic Analyzer.
Tagged Test & Measurement Development
| Leave a replyBeagle USB 5000 v2 SuperSpeed Protocol Analysers feature Cypress' EZ-USB FX3 Solution
Total Phase has unveiled their new series of Beagle USB 5000 v2 SuperSpeed Protocol Analysers. These new models build on the reliable technology seen in the original Beagle analysers, adding advanced features such as SuperSpeed USB downlink and multi-analyser synchronization to allow engineers to access their captured data with unparalleled precision and speed.
Combined with Total Phase’s signature real-time analysis and display technologies, users will be able to debug their USB 3.0 applications faster than ever before.
“SuperSpeed USB adoption has dramatically increased, as evidenced by many new PC and CE devices entering the market - The introduction of the USB 3.0 analysis port on Total Phase’s Beagle USB 5000 v2 analyser, demonstrates SuperSpeed USB functionality provides value to the test and measurement industry,” said Jeff Ravencraft, Chairman, USB-IF. “Release of this device is not only an indication of the increasing adoption rate of SuperSpeed USB technology, but is also evidence that developers have embraced SuperSpeed USB and are using it for viewing and analysing large volumes of data.”
Tagged Test & Measurement Development News
| Leave a replyIntroducing the New Beagle USB 5000 v2 SuperSpeed Protocol Analyzer from Total Phase
Total Phase is excited to introduce the all new series of the Beagle USB 5000 v2 SuperSpeed Protocol Analyzer! These new models build on the reliable technology seen in the original Beagle USB analyzers, adding advanced features such as the SuperSpeed USB (USB 3.0) downlink and multi-analyzer synchronization to allow engineers to access their captured data with unparalleled precision and speed. Combined with Total Phase signature real-time analysis and display technologies, users will be able to debug their USB 3.0 applications faster than ever before.
Tagged Test & Measurement Development News
| Leave a reply"With the SPI Storm device, we observed the highest effective data throughput we have seen on any USB-connected SPI adapter..." - says a customer.
SPI Storm is the first high-speed SPI Adapter that also supports Dual- and Quad- SPI protocols. In addition, virtually any custom serial protocol up to 100 MHz can be set up with its advanced protocol definition engine.
Request a 30 days free trial now!
Tagged Test & Measurement Development
| Leave a replyDebug and capture the USB 3.0 protocol in less than two minutes, is it really that easy?
Tagged Test & Measurement Development
| Leave a replyFirst, learn the four steps by watching this video below:
They both increase visibility on embedded systems, but what are they good at?
In the world of general-purpose equipment used to troubleshoot embedded systems, oscilloscopes hold a central place, as 'all-around' tool for all kinds of embedded systems. Digital and mixed-signal oscilloscopes sometimes provide high-level functionalities - such as protocol decoding.
Still, from physical layer to application software, debugging (and verifying, and testing, ...) embedded system will likely require 'more than just a scope'. Byte Paradigm recently investigated the reasons why engineers use other types of general-purpose equipment. We were especially interested in the technical value of digital data logger for embedded system debugging. Figure 1 below summarizes the main findings.
These results originate from systematic informal discussions with visitors at the 2012 editions of Embedded World (Nuremberg, Germany) and Design West (San Jose, USA).
Figure 1: Overlapping areas show that tools are often used interchangeably or together.
Colored arrows show the main reasons why a user would prefer to switch from one Type of equipment to another. Some intersecting areas are labeled with frequently-mentioned tool use.
Tagged Test & Measurement Development
| Leave a reply
Tagged Test & Measurement Development
| Leave a reply